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Silicon nitride hardmask fabrication using a cyclic CHF3-based reactive ion etching process for vertical profile nanostructures

  作者 Kaspar, P; Jeyaram, Y; Jackel, H; Foelske, A; Kotz, R; Bellini, S  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2010年28-6;  页码  1179-1186  
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[摘要]A cyclic approach to silicon nitride dry-etching is presented, which differs in concept from most established high aspect ratio etching processes. Alternating steps of CHF3 etching and oxygen plasma treatment are applied to form vertical sidewalls. During

 
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