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A Phased Array RFIC With Built-In Self-Test Capabilities

  作者 Inac, O; Shin, D; Rebeiz, GM  
  选自 期刊  IEEE Transactions on Microwave Theory and Techniques;  卷期  2012年60-1;  页码  139-148  
  关联知识点  
 

[摘要]An X-Band phased-array RF integrated circuit with built-in self-test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Systematic effects introd

 
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