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Si clusters on reconstructed SiC (0001) revealed by surface extended x-ray absorption fine structure

作者	Gao, XY; Chen, S; Liu, T; Chen, W; Wee, ATS; Nomoto, T; Yagi, S; Soda, K; Yuhara, J

选自	期刊 Applied Physics Letters; 卷期 2009年95-14; 页码 144102-144102

关联知识点

[摘要]：The evolution of silicon carbide (0001) surface reconstruction upon annealing has been studied by Si K edge extended x-ray absorption fine structure (EXAFS). Using Si KVV Auger electron yield at different emission angles with different surface sensitiviti
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