Transformation from an atomically stepped NiO thin film to a nanotape structure: A kinetic study using x-ray diffraction - art. no. 241904

[摘要]：Transformation from an atomically stepped epitaxial thin film of NiO to a self-assemble nanotape structure at the step edge was observed in situ using synchrotron x-ray diffraction. The pristine NiO thin film was epitaxially grown on an ultrasmooth sapphi

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