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Determination of internal parameters for AlGaN-cladding-free m-plane InGaN/GaN laser diodes - art. no. 171115

  作者 Farrell, RM; Haeger, DA; Hsu, PS; Fujito, K; Feezell, DF; DenBaars, SP; Speck, JS; Nakamura, S  
  选自 期刊  Applied Physics Letters;  卷期  2011年99-17;  页码  71115-71115  
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[摘要]The dependence of device characteristics on cavity length is used to determine the injection efficiency, internal loss, and material gain of electrically injected AlGaN-cladding-free m-plane InGaN/GaN laser diodes. Estimates for the transparency carrier density are discussed in the context of recombination coefficients that have been reported for c-plane InGaN-based light-emitting devices. (C) 2011 American Institute of Physics. [doi:10.1063/1.3657149]

 
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