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Study of AlN dielectric film on graphene by Raman microscopy

  作者 Jin, Z; Su, YB; Chen, JW; Liu, XY; Wu, DX  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-23;  页码  233110-233110  
  关联知识点  
 

[摘要]Dielectric film on graphene severely affects the performance of graphene field-effect transistors (GFETs). The authors investigated AlN dielectric film on graphene by Raman microscopy. AlN deposition led to the appearance of disorder-related peaks and to

 
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