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Programming margin enlargement by material engineering for multilevel storage in phase-change memory

  作者 Yin, Y; Noguchi, T; Ohno, H; Hosaka, S  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-13;  页码  133503-133503  
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[摘要]In this work, we investigate the effect of the material engineering on programming margin in the double-layered phase-change memory, which is the most important parameter for the stability of multilevel storage. Compared with the TiN/SbTeN cell, the TiSiN

 
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