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Tunable Catalytic Alloying Eliminates Stacking Faults in Compound Semiconductor Nanowires

  作者 Heo, H; Kang, K; Lee, D; Jin, LH; Back, HJ; Hwang, I; Kim, M; Lee, HS; Lee, BJ; Yi, GC; Cho, YH; Jo, MH  
  选自 期刊  Nano Letters;  卷期  2012年12-2;  页码  855-860  
  关联知识点  
 

[摘要]Planar defects in compound (III-V and II-VI) semiconductor nanowires (NWs), such as twin and stacking faults, are universally formed during the catalytic NW growth, and they detrimentally act as static disorders against coherent electron transport and lig

 
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