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Enhancing the retention properties of ZnO memory transistor by modifying the channel/ferroelectric polymer interface

  作者 Park, CH; Lee, G; Lee, KH; Im, S; Lee, BH; Sung, MM  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-15;  页码  153502-153502  
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[摘要]We report on the fabrication of ZnO nonvolatile memory thin-film transistors (NVM-TFTs) with thin poly(vinylidene fluoride/trifluoroethylene) [P(VDF-TrFE)] ferroelectric layer. Our NVM-TFT operates on glass substrates under low voltage write-erase (WR-ER)

 
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