个性化文献订阅>期刊> Applied Physics Letters
 

Electric force microscopy imaging of charge accumulation and barrier lowering at Al/pentacene junction

  作者 Kim, C; Jeon, D  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-15;  页码  153302-153302  
  关联知识点  
 

[摘要]We investigated the current-voltage and interface properties of the Al/pentacene/ Au sandwiched sample. When the bias voltage was applied between Al and Au, a rectifying current-voltage curve was obtained as expected from the energy diagram. When measured

 
      被申请数(0)  
 

[全文传递流程]

一般上传文献全文的时限在1个工作日内