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CMOS charge pump with transfer blocking technique for no reversion loss and relaxed clock timing restriction

  作者 Kim, Joung-Yeal (1); Jun, Young-Hyun (2); Kong, Bai-Sun (1)  
  选自 期刊  IEEE Transactions on Circuits and Systems II;  卷期  2009年56-1;  页码  11-15  
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[摘要]A CMOS charge pump based on a transfer blocking technique and a modified precharge scheme is proposed for avoiding reversion loss and relaxing the timing restrictions imposed on input clocks. Comparison results in an 80-nm CMOS process indicate that, with

 
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