个性化文献订阅>期刊> Applied Physics Letters
 

Major impacts of point defects and impurities on the carrier recombination dynamics in AlN

  作者 Chichibu, SF; Onuma, T; Hazu, K; Uedono, A  
  选自 期刊  Applied Physics Letters;  卷期  2010年97-20;  页码  201904-201904  
  关联知识点  
 

[摘要]Impacts of point defects and impurities on the carrier recombination dynamics in AlN are revealed by time-resolved spectroscopy and positron annihilation measurements. Intrinsically short low-temperature excitonic radiative lifetime (tau(R) similar to 10

 
      被申请数(0)  
 

[全文传递流程]

一般上传文献全文的时限在1个工作日内