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An Electrically Tuned Solid-State Thermal Memory Based on Metal-Insulator Transition of Single-Crystalline VO(2) Nanobeams

  作者 Xie, RG; Bui, CT; Varghese, B; Zhang, QX; Sow, CH; Li, BW; Thong, JTL  
  选自 期刊  ADVANCED FUNCTIONAL MATERIALS;  卷期  2011年21-9;  页码  1602-1607  
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[摘要]A solid-state thermal memory that can store and retain thermal information with temperature states as input and output is demonstrated experimentally. A single-crystal VO(2) nanobeam is used, undergoing a metal-insulator transition at similar to 340 K, to obtain a nonlinear and hysteresis response in temperature. It is shown that the application of a voltage bias can substantially tune the characteristics of the thermal memory, to an extent that the heat conduction can be increased similar to 60%, and the output HIGH/LOW temperature difference can be amplified over two orders of magnitude compared to an unbiased device. The realization of a solid-state thermal memory combined with an effective electrical control thus allows the development of practical thermal devices for nano-to macroscale thermal management.

 
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