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Improvement of Ohmic contacts to In0.65Ga0.35Sb using Mo refractory metal and surface preparation for 6.3 A degrees heterojunction bipolar transistors

  作者 Mairiaux, E; Desplanque, L; Wallart, X; Zaknoune, M  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2010年28-1;  页码  17-20  
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[摘要]This article describes a comparative study of Ti/Au, Ti/Pd/Au, Ti/Pt/Au, Mo/Au, Mo/Pt/Au, and Pd/Mo/Pt/Au Ohmic contacts to both n- and p-In0.65Ga0.35Sb. For In0.65Ga0.35Sb:Te doped to 2x10(18) cm(-3), specific contact resistivities rho(c) below 2x10(-6)

 
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