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Deep traps and thermal measurements on AlGaN/GaN on Si transistors - art. no. 042201

  作者 Lo, CF; Ren, F; Pearton, SJ; Polyakov, AY; Smirnov, NB; Govorkov, AV; Belogorokhov, IA; Belogorokhov, AI; Reznik, VY; Johnson, JW  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2011年29-4;  页码  42201-42201  
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[摘要]AlGaN/GaN structures grown on Si substrates by metal organic chemical vapor deposition have been processed into high power transistors with maximum input power density of 12 W/mm. The transistor showed low concentration of bulk electron traps in the GaN b

 
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