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In situ probing of electromechanical properties of an individual ZnO nanobelt

  作者 Asthana, A; Momeni, K; Prasad, A; Yap, YK; Yassar, RS  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-17;  页码  172106-172106  
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[摘要]We report here, an investigation on electrical and structural-microstructural properties of an individual ZnO nanobelt via in situ transmission electron microscopy using an atomic force microscopy (AFM) system. The I-V characteristics of the ZnO nanobelt,

 
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