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High-yield dielectrophoretic assembly of two-dimensional graphene nanostructures - art. no. 053110

  作者 Burg, BR; Lutolf, F; Schneider, J; Schirmer, NC; Schwamb, T; Poulikakos, D  
  选自 期刊  Applied Physics Letters;  卷期  2009年94-5;  页码  53110-53110  
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[摘要]Graphene handling is still dominated by serial mechanical exfoliation, which may well facilitate measurements in a laboratory environment but does not allow reliable larger-scale integration. Herein we demonstrate the controlled, high-yield (>90%), site-selective deposition of ultrathin few-layer (three to ten) graphene oxide by dielectrophoresis between prefabricated electrodes. Individual layers are found near the edges. Initially insulating, thermal reduction at 450 degrees C thins out the two-dimensional few-atom thick films and dramatically reduces electrical resistances down to 40 k Omega. Conductivities between 15 and 36 S/cm are obtained. The introduced method permits the nonintrusive, parallel, large-scale assembly of soluble two-dimensional nanostructures and sheets.

 
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