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Compensation and carrier trapping in indium-doped CdTe: Contributions from an important near-mid-gap donor - art. no. 052102

  作者 Babentsov, V; Franc, J; James, RB  
  选自 期刊  Applied Physics Letters;  卷期  2009年94-5;  页码  52102-52102  
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[摘要]We report on the recharging of the neutral state of a deep-donor layer that increases the efficiency of charge collection in detector-grade CdTe:In. Measurements with photoinduced current transient spectroscopy and thermoelectric effect spectroscopy revealed positively charged energy level at E-C-0.65 eV. Photoluminescence measurements identified this level being responsible for the 0.68 eV emission band. Its positive charge is converted into a neutral one by the upward displacement of Fermi level. We discuss the nature of this deep defect based on the latest ab initio calculations.

 
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