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Near-field modal microscopy of subwavelength light confinement in multimode silicon slot waveguides - art. no. 251103

  作者 Foubert, K; Lalouat, L; Cluzel, B; Picard, E; Peyrade, D; Delamadeleine, E; de Fornel, F; Hadji, E  
  选自 期刊  Applied Physics Letters;  卷期  2008年93-25;  页码  51103-51103  
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[摘要]Silicon-on-insulator slot waveguides are studied by scanning near-field optical microscopy. Images of the standing wave pattern were established experimentally and compared with numerical simulations. Fourier analysis along the propagation direction revea

 
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