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Single charge sensing and transport in double quantum dots fabricated from commercially grown Si/SiGe heterostructures - art. no. 043508

  作者 Payette, C; Wang, K; Koppinen, PJ; Dovzhenko, Y; Sturm, JC; Petta, JR  
  选自 期刊  Applied Physics Letters;  卷期  2012年100-4;  页码  43508-43508  
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[摘要]We perform quantum Hall measurements on three types of commercially available modulation-doped Si/SiGe heterostructures to determine their suitability for depletion gate defined quantum dot devices. By adjusting the growth parameters, we are able to achie

 
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