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Utilizing Process Variations for Reference Generation in a Flash ADC

  作者 Sundstrom, T; Alvandpour, A  
  选自 期刊  IEEE Transactions on Circuits and Systems II;  卷期  2009年56-5;  页码  364-368  
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[摘要]This brief presents an experimental study on how to take advantage of the increasing process variations in nanoscale CMOS technologies to achieve small and low-power high-speed analog-to-digital converters (ADCs). Particularly, the need for a reference voltage generation network has been eliminated in a 4-bit Flash ADC in 90-nm CMOS, with small-sized comparators. The native comparator offsets, resulting from the process-variation-induced mismatch, are used as the only source of reference levels, and redundancy is used to acquire the desired resolution. The measured performance of the 1.5-GS/s ADC is comparable to traditional state-of-the art ADCs and dissipates 23 mW.

 
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