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An electrical switching device controlled by a magnetic field-dependent impact ionization process

  作者 Lee, J; Joo, S; Kim, T; Kim, KH; Rhie, K; Hong, J; Shin, KH  
  选自 期刊  Applied Physics Letters;  卷期  2010年97-25;  页码  253505-253505  
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[摘要]An abrupt change of conductance at a threshold magnetic field was observed in a device consisting of a nonmagnetic narrow-gap semiconductor. The conductance varies more than 25 times as the magnetic field increases. The threshold magnetic field can be tuned using a bias voltage from zero to several hundred Gauss. This large magnetoconductance effect is caused by the magnetic field-dependent impact ionization process. A theoretical model is proposed, and calculations based on this model simulate the experimental results closely. This device may be a good candidate for an electrical switching device controlled by a magnetic field. (C) 2010 American Institute of Physics. [doi:10.1063/1.3532105]

 
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