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Dual-mode device for in situ testing of MEMS packaging quality

  作者 Suijlen, MAG; van der Avoort, C; van Beek, JTM; Koning, JJ; Beijerinck, HCW  
  选自 期刊  Sensors And Actuators A-Physical;  卷期  2012年175-1;  页码  139-149  
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[摘要]A method is presented to rapidly characterize the hermeticity of a vacuum cavity for a high frequency (omega(0)/(2 pi)= 56 MHz) micromechanical bulk-wave resonator. The method relies on operating the device in a low-stiffness out-of-plane resonance mode.

 
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