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Suppression of microwave rectification effects in electrically detected magnetic resonance measurements - art. no. 063510

  作者 Lo, CC; Bradbury, FR; Tyryshkin, AM; Weis, CD; Bokor, J; Schenkel, T; Lyon, SA  
  选自 期刊  Applied Physics Letters;  卷期  2012年100-6;  页码  63510-63510  
  关联知识点  
 

[摘要]Spin-dependent transport properties of micro- and nano-scale electronic devices are commonly studied by electrically detected magnetic resonance (EDMR). However, the applied microwave fields in EDMR experiments can induce large rectification effects and r

 
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