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Role of copper in light induced minority-carrier lifetime degradation of silicon

  作者 Savin, H; Yli-Koski, M; Haarahiltunen, A  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-15;  页码  152111-152111  
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[摘要]We investigate the impact of copper on the light induced minority-carrier lifetime degradation in various crystalline silicon materials. We demonstrate here that the presence of neither boron nor oxygen is necessary for the degradation effect. In addition

 
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