- Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults
[作者:Song, J; Han, J; Yi, H; Jung, T; Park, S,期刊:IEEE Transactions on Circuits and Systems II, 页码:419-423 , 文章类型: Article,,卷期:2009年56-5]
- The effect of crosstalk-induced errors becomes more significant in high-performance circuits and systems. In this paper, compact crosstalk test patterns are introduced for a system-on-a-chip and board level interconnects...
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