- Highly compact interconnect test patterns for crosstalk and static faults
[作者:Song, Jaehoon (1); Han, Juhee (1); Yi, Hyunbean (2); Jung, Taejin (1); Park, Sungju (1) ,期刊:IEEE Transactions on Circuits and Systems II, 页码:56-60 , 文章类型: article (JA),,卷期:2009年56-1]
- The effect of crosstalk-induced errors becomes more significant in high-performance circuits and systems. In this paper, compact crosstalk test patterns are introduced for a system-on-a-chip and board level interconnects...
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