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  • Bistability, higher harmonics, and chaos in AFM
    [作者:Stark, RW,期刊:Materials Today, 页码:24-32 , 文章类型: Article,,卷期:2010年13-9]
  • A dynamic atomic force microscope sensitively probes surface properties with subnanometre lateral resolution. In the amplitude modulation mode, the force-sensing tip oscillates a few nanometres. The force sensor is a har...