- Electron Tomography on Micrometer-Thick Specimens with Nanometer Resolution
[作者:Loos, J; Sourty, E; Lu, K; Freitag, B; Tang, D; Wall, D,期刊:Nano Letters, 页码:1704-1708 , 文章类型: Letter,,卷期:2009年9-4]
- Transmission electron microscopy (TEM) is a well-established technique to explore matter down to the atomic scale. TEM tomography methods have been developed to obtain volume information at the mesoscopic dimensions of d...
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