- Multiangle dynamic light scattering analysis using angular intensity weighting determined by iterative recursion
[作者:Liu, XY; Shen, J; Thomas, JC; Shi, SJ; Sun, XM; Liu, W,期刊:APPLIED OPTICS, 页码:846-854 , 文章类型: Article,,卷期:2012年51-7]
- Multiangle dynamic light scattering (MDLS) can provide better results for particle size distribution (PSD) determination than single-angle dynamic light scattering. Proper analysis of MDLS data requires data from each me...
- Rapid optimization of cost-based tolerancing
[作者:Yabe, A,期刊:APPLIED OPTICS, 页码:855-860 , 文章类型: Article,,卷期:2012年51-7]
- In this paper, a rapid optimization method of cost-based tolerancing is proposed. An example shows that only a few cases of the Monte Carlo simulation are necessary to find the best balance of the yield and the tolerance...
- Schottky barrier characteristics and internal gain mechanism of TiO2 UV detectors
[作者:Zhang, HF; Zhang, M; Feng, CH; Chen, WY; Liu, CX; Zhou, JR; Ruan, SP,期刊:APPLIED OPTICS, 页码:894-897 , 文章类型: Article,,卷期:2012年51-7]
- High-responsivity metal-semiconductor-metal TiO2 UV photodetectors with Ni and Au electrodes were fabricated identically. Their Schottky barrier heights and photocurrent gain mechanism were studied. The effective barrier...
- Origin of particles during reactive sputtering of oxides using planar and cylindrical magnetrons
[作者:Rademacher, D; Fritz, B; Vergohl, M,期刊:APPLIED OPTICS, 页码:927-935 , 文章类型: Article,,卷期:2012年51-7]
- Particles generated during reactive magnetron sputtering cause defects in optical thin films, which may lead to losses in optical performance, pinholes, loss of adhesion, decreased laser-induced damage thresholds and man...
- Robust camera pose estimation from unknown or known line correspondences
[作者:Zhang, XH; Zhang, Z; Li, Y; Zhu, XW; Yu, QF; Ou, JL,期刊:APPLIED OPTICS, 页码:936-948 , 文章类型: Article,,卷期:2012年51-7]
- We address the model-to-image registration problem with line features in the following two ways. (a) We present a robust solution to simultaneously recover the camera pose and the three-dimensional-to-two-dimensional lin...
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