- Tuning exchange bias by thermal fluctuation in Fe52Mn23Ga25 melt-spun ribbons - art. no. 222506
[作者:Tang, XD; Wang, WH; Wu, GH; Meng, FB; Liu, HY; Luo, HZ,期刊:Applied Physics Letters, 页码:22506-22506 , 文章类型: Article,,卷期:2011年99-22]
- In Fe52Mn23Ga25 ribbons, the exchange bias becomes very sensitive to the proportions and sizes of the ferromagnetic (FM) and antiferromagnetic (AFM) phases. With high cooling fields, the AFM clusters with small sizes are...
- Role of copper in time dependent dielectric breakdown of porous organo-silicate glass low-k materials - art. no. 222110
[作者:Zhao, L; Pantouvaki, M; Croes, K; Tokei, Z; Barbarin, Y; Wilson, CJ; Baklanov, MR; Beyer, GP; Claeys, C,期刊:Applied Physics Letters, 页码:22110-22110 , 文章类型: Article,,卷期:2011年99-22]
- The role of copper in time dependent dielectric breakdown (TDDB) of a porous low-k dielectric with TaN/Ta barrier was investigated on a metal-insulator-metal capacitor configuration where Cu ions can drift into the low-k...
- On the "U-shaped" continuum of band edge states at the Si/SiO2 interface - art. no. 223516
[作者:Ryan, JT; Southwick, RG; Campbell, JP; Cheung, KP; Young, CD; Suehle, JS,期刊:Applied Physics Letters, 页码:23516-23516 , 文章类型: Article,,卷期:2011年99-22]
- The historical and near universal acceptance that a U-shaped continuum of band edge states intrinsically exists at the Si/SiO2 boundary is re-examined. Using a recently developed interface defect spectroscopy method, we ...
|