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  • Erbium diffusion in silicon dioxide
    [作者:Lu, YW; Julsgaard, B; Petersen, MC; Jensen, RVS; Pedersen, TG; Pedersen, K; Larsen, AN,期刊:Applied Physics Letters, 页码:141903-141903 , 文章类型: Article,,卷期:2010年97-14]
  • Erbium diffusion in silicon dioxide layers prepared by magnetron sputtering, chemical vapor deposition, and thermal growth has been investigated by secondary ion mass spectrometry, and diffusion coefficients have been ex...
  • A TiAl2O5 nanocrystal charge trap memory device
    [作者:Zhou, Y; Yin, JA; Xu, HN; Xia, YD; Liu, ZG; Li, AD; Gong, YP; Pu, L; Yan, F; Shi, Y,期刊:Applied Physics Letters, 页码:143504-143504 , 文章类型: Article,,卷期:2010年97-14]
  • A charge trapping memory device using Ti0.2Al0.8Ox film as charge trapping layer and amorphous Al2O3 as the tunneling and blocking layers was fabricated for nonvolatile memory application. TiAl2O5 nanocrystals are precip...
  • Thermally evaporated Cu2ZnSnS4 solar cells
    [作者:Wang, K; Gunawan, O; Todorov, T; Shin, B; Chey, SJ; Bojarczuk, NA; Mitzi, D; Guha, S,期刊:Applied Physics Letters, 页码:143508-143508 , 文章类型: Article,,卷期:2010年97-14]
  • High efficiency Cu2ZnSnS4 solar cells have been fabricated on glass substrates by thermal evaporation of Cu, Zn, Sn, and S. Solar cells with up to 6.8% efficiency were obtained with absorber layer thicknesses less than 1...