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  • March Test Generation Revealed
    [作者:Benso, A; Bosio, A; Di Carlo, S; Di Natale, G; Prinetto, P,期刊:IEEE Transactions on Computers, 页码:1704-1713 , 文章类型: Article,,卷期:2008年57-12]
  • Memory testing commonly faces two issues: the characterization of detailed and realistic fault models and the definition of time-efficient test algorithms. Among the different types of algorithms proposed for testing Sta...