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  • Defect chemistry of Ti-doped antiferroelectric Bi0.85Nd0.15FeO3
    [作者:Reaney, IM; MacLaren, I; Wang, LQ; Schaffer, B; Craven, A; Kalantari, K; Sterianou, I; Miao, S; Karimi, S; Sinclair, DC,期刊:Applied Physics Letters, 页码:182902-182902 , 文章类型: Article,,卷期:2012年100-18]
  • Aberration corrected scanning transmission electron microscopy revealed that Bi0.85Nd0.15Fe0.9Ti0.1O3 ceramics contain coherent Nd-rich precipitates distributed throughout the perovskite lattice, implying charge compensa...
  • Stress-relaxed growth of n-GaN epilayers
    [作者:Ryu, JH; Katharria, YS; Kim, HY; Kim, HK; Ko, KB; Han, N; Kang, JH; Park, YJ; Suh, EK; Hong, CH,期刊:Applied Physics Letters, 页码:181904-181904 , 文章类型: Article,,卷期:2012年100-18]
  • A significant stress-relaxation was observed in GaN epilayers by integrating a heavily Si-doped GaN (n(+)-GaN) sacrificial layer in the undoped GaN templates grown on sapphire substrates by metal-organic chemical vapor d...
  • Quantum point contact with large subband energy spacings
    [作者:Um, YJ; Oh, YH; Seo, M; Lee, S; Chung, Y; Kim, N; Umansky, V; Mahalu, D,期刊:Applied Physics Letters, 页码:183502-183502 , 文章类型: Article,,卷期:2012年100-18]
  • Quantum point contact (QPC) with an extra metallic gate in between the split gates of a conventional QPC was fabricated and studied. Clear conductance quantization was observed at 4.2 K when a proper positive voltage was...
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