- Comments on "Low Diameter Interconnections for Routing in High-Performance Parallel Systems," with Connections and Extensions to Arc Coloring of Coset Graphs
[作者:Xiao, WJ; Wei, WH; Chen, WD; He, MX; Parhami, B,期刊:IEEE Transactions on Computers, 页码:1726-1728 , 文章类型: Editorial Material,,卷期:2008年57-12]
- Recently, Melhem presented a "new" class of low-diameter interconnection (LDI) networks in this journal [10]. We note that LDI networks are the same as the previously known generalized de Bruijn graphs, point out an erro...
- Immunet: Dependable Routing for Interconnection Networks with Arbitrary Topology
[作者:Puente, V; Gregorio, JA; Vallejo, F; Beivide, R,期刊:IEEE Transactions on Computers, 页码:1676-1689 , 文章类型: Article,,卷期:2008年57-12]
- A complete mechanism for tolerating multiple failures in parallel computer systems, denoted as Immunet, is described in this paper. Immunet can be applied to arbitrary topologies, either regular or irregular, exhibiting ...
- Ordered Round-Robin: An Efficient Sequence Preserving Packet Scheduler
[作者:Yao, JN; Guo, JN; Bhuyan, LN,期刊:IEEE Transactions on Computers, 页码:1690-1703 , 文章类型: Article,,卷期:2008年57-12]
- With the advent of powerful network processors (NPs) in the market, many computation-intensive tasks such as routing table lookup, classification, IPSec, and multimedia transcoding can now be accomplished more easily in ...
- March Test Generation Revealed
[作者:Benso, A; Bosio, A; Di Carlo, S; Di Natale, G; Prinetto, P,期刊:IEEE Transactions on Computers, 页码:1704-1713 , 文章类型: Article,,卷期:2008年57-12]
- Memory testing commonly faces two issues: the characterization of detailed and realistic fault models and the definition of time-efficient test algorithms. Among the different types of algorithms proposed for testing Sta...
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