- An input vector monitoring concurrent BIST architecture based on a precomputed test set
[作者:Voyiatzis, I; Paschalis, A; Gizopoulos, D; Halatsis, C; Makri, FS; Hatzimihail, M,期刊:IEEE Transactions on Computers, 页码:1012-1022 , 文章类型: Article,,卷期:2008年57-8]
- Built-In Self-Test (BIST) techniques constitute an effective and practical approach for VLSI circuits testing. BIST schemes are typically classified into two categories: offline and online. Input vector monitoring concur...
- A current mode, parallel, two-rail code checker
[作者:Matakias, S; Tsiatouhas, Y; Haniotakis, T; Arapoyanni, A,期刊:IEEE Transactions on Computers, 页码:1032-1045 , 文章类型: Article,,卷期:2008年57-8]
- A current mode periodic output parallel two-rail code (TRC) checker, suitable for the implementation of high fan-in embedded checkers, is presented. The new checker is characterized by high testability, high-speed operat...
- Modeling toroidal networks with the Gaussian integers
[作者:Martinez, C; Beivide, R; Stafford, E; Moreto, M; Gabidulin, EM,期刊:IEEE Transactions on Computers, 页码:1046-1056 , 文章类型: Article,,卷期:2008年57-8]
- In this paper, we consider a broad family of toroidal networks, denoted as Gaussian networks, which include many previously proposed and used topologies. We will define such networks by means of the Gaussian integers, th...
- Testing a collaborative DDoS defense in a red team/blue team exercise
[作者:Mirkovic, J; Reiher, P; Papadopoulos, C; Hussain, A; Shepard, M; Berg, M; Jung, R,期刊:IEEE Transactions on Computers, 页码:1098-1112 , 文章类型: Article,,卷期:2008年57-8]
- Testing security systems is challenging because a system's authors have to play the double role of attackers and defenders. Red Team/Blue Team exercises are an invaluable mechanism for security testing. They partition re...
- A CDF-based tool for studying temperature in rack-mounted servers
[作者:Choi, J; Kim, Y; Sivasubramaniam, A; Srebric, J; Wang, Q; Lee, J,期刊:IEEE Transactions on Computers, 页码:1129-1142 , 文章类型: Article,,卷期:2008年57-8]
- Temperature-aware computing is becoming more important in the design of computer systems as power densities are increasing and the implications of high operating temperatures result in higher failure rates of components ...
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