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  • Spectroscopic ellipsometry of few-layer graphene
    [作者:Isic, G; Jakovljevic, M; Filipovic, M; Jovanovic, D; Vasic, B; Lazovic, S; Puac, N; Petrovic, ZL; Kostic, R; Gajic, R; Humlicek, J; Losurdo, M; Bruno, G; Bergmair, I; Hingerl, K,期刊:JOURNAL OF NANOPHOTONICS, 页码:51809-51809 , 文章类型: Article,,卷期:2011年5-6]
  • The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was foun...