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  • Spot distribution measurement using a scanning nanoslit
    [作者:George, A; Milster, TD,期刊:APPLIED OPTICS, 页码:4746-4754 , 文章类型: Article,,卷期:2011年50-24]
  • A scanning and rotating nanoslit is used to measure submicrometer features in focused spot distributions. Using a filtered backprojection technique, a highly accurate reconstruction is demonstrated. Experimental results ...
  • Improved multiple-pass Raman spectrometer
    [作者:Utsav, KC; Silver, JA; Hovde, DC; Varghese, PL,期刊:APPLIED OPTICS, 页码:4805-4816 , 文章类型: Article,,卷期:2011年50-24]
  • An improved Raman gain spectrometer for flame measurements of gas temperature and species concentrations is described. This instrument uses a multiple-pass optical cell to enhance the incident light intensity in the meas...